Seoul National Univ. DMSE
People
Faculty
Kim, Miyoung
professor
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Mailstop
33-220
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Phone
02-880-9293
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Fax
02-884-1413
- Homepage
Education
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1998
Ph.D : Arizona State University, Department of Physics
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1992
M.S : Seoul National University, Department of Physics
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1990
B.S : Seoul National University, Department of Physics
Career
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2013-Present
Seoul National University, Professor
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2008-2013
Seoul National University, Associate Professor
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2004-2008
Seoul National University, Associate Professor
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2001-2004
AE-Center, Samsung Advanced Institute of Technology, Senior Researcher
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1998-2001
Solid State Division, Oak Ridge National Lab, Post- Doct
Research Interests
1. Crystal structures
* Structural analysis through (scanning) transmission electron microscopy ((S)TEM), convergent beam electron diffraction (CBED) and nano-area electron diffraction (NED)
* Atomic configurations at surfaces, interfaces, and defect structures
2. Electronic structures
* Analyzing electronic structure of functional materials through electron energy loss spectroscopy (EELS) and density functional theory (DFT) calculations
* Electronic structures of interfaces, grain boundaries, and defects
3. Nano scale measurements of charge distribution and strain fields
* Charge distribution in nanostructures using CBED or STEM images
* Measuring strain field in semiconductor/optical devices or in multilayered thin films
4. In-situ I-V measurements in TEM
* I-V measurements in TEM with an in-situ scanning tunneling microscopy (STM)/TEM double tilt holder
* Direct measurements of local conductivity in nanomaterials, interfaces, grain boundaries, and defects
* Structural analysis through (scanning) transmission electron microscopy ((S)TEM), convergent beam electron diffraction (CBED) and nano-area electron diffraction (NED)
* Atomic configurations at surfaces, interfaces, and defect structures
2. Electronic structures
* Analyzing electronic structure of functional materials through electron energy loss spectroscopy (EELS) and density functional theory (DFT) calculations
* Electronic structures of interfaces, grain boundaries, and defects
3. Nano scale measurements of charge distribution and strain fields
* Charge distribution in nanostructures using CBED or STEM images
* Measuring strain field in semiconductor/optical devices or in multilayered thin films
4. In-situ I-V measurements in TEM
* I-V measurements in TEM with an in-situ scanning tunneling microscopy (STM)/TEM double tilt holder
* Direct measurements of local conductivity in nanomaterials, interfaces, grain boundaries, and defects
Selected Publications
1. Papers
* Direct observation of d-orbital holes and Cu-Cu bonding in Cu2O , Nature, 401,49 (1999)
* High-frequency micromechanical resonators from aluminium-carbon nanotube nanolaminates , Nat. Mater., 7, 457 (2008)
* Electron energy-loss spectroscopy analysis of HfO2 dielectric films on strained and relaxed SiGe/Si substrates , Appl. Phys. Lett., 92, 232906 (2008)
* Atomic structure of conducting nanofilaments in TiO2 resistive switching memory , Nat. Nanotechnol., 5, 148 (2010)
* Nearly single-crystalline GaN light-emitting diodes on amorphous glass substrates , Nat. Photonics, 5, 763 (2011)
* Direct observation of d-orbital holes and Cu-Cu bonding in Cu2O , Nature, 401,49 (1999)
* High-frequency micromechanical resonators from aluminium-carbon nanotube nanolaminates , Nat. Mater., 7, 457 (2008)
* Electron energy-loss spectroscopy analysis of HfO2 dielectric films on strained and relaxed SiGe/Si substrates , Appl. Phys. Lett., 92, 232906 (2008)
* Atomic structure of conducting nanofilaments in TiO2 resistive switching memory , Nat. Nanotechnol., 5, 148 (2010)
* Nearly single-crystalline GaN light-emitting diodes on amorphous glass substrates , Nat. Photonics, 5, 763 (2011)
Lab Overview
Holding Techniques
1) Quantitative analysis using convergent beam electron diffraction (CBED) and nano-area electron diffraction (NED)
2) Quantitative analysis of composition and structure through (scanning) transmission electron microscopy ((S)TEM)
3) Interpretation on electronic structure through electron energy loss spectroscopy (EELS) and density functional theory (DFT) calculation
4) I-V measurement of the materials employing In-situ STM/TEM double tilt holder
1) Quantitative analysis using convergent beam electron diffraction (CBED) and nano-area electron diffraction (NED)
2) Quantitative analysis of composition and structure through (scanning) transmission electron microscopy ((S)TEM)
3) Interpretation on electronic structure through electron energy loss spectroscopy (EELS) and density functional theory (DFT) calculation
4) I-V measurement of the materials employing In-situ STM/TEM double tilt holder