Seoul National Univ. DMSE
People
Faculty
Kim, Young-Woon
김영운
youngwk@snu.ac.kr
Mailstop
33-307
Phone
880-7977
Fax
883-8197
Education
- 1995
Ph. D : University of Illinois at Urbana-Champaign, Department of Materials Science & Engineering
- 1985
M.S : M.S : Seoul National University, Department of Metallurgical Engineering
- 1983
B.S : Seoul National University, Department of Metallurgical Engineering
Career
- 2001 ~ present
Seoul National University, Professor
- 1999 ~ 2001
University of Illinois, Material Laboratory, Senior Researcher
- 1995 ~ 1999
Intel Corp. (Santa Clara, USA), Senior Process Engineer
- 1986 ~ 1988
Korea Advanced Institute of Science and Technology, Functional Metallic Material Laboratory, Researcher
Research Interests
1. In-situ Electron Microscopy* Correlation between micro-structure and physical properties in nano-electrical ReRAM devices
* Cathodeluminescence of materials for LED and solar cells.
* Initial stage of surface reaction in anodic reaction of lithium rechargeable battery in in-situ TEM
* In-situ heating-deformation dynamics in high-Mn steels.
* Oxidation kinetics in the pure metal surface using in-situ oxidation2. Interface Control* Surface oxide control in high-Mn steel using dew-point and plasma treatment
* High-Al coating on alloy steel for automobile
* Decomposition of Mg alloy under bio-chemical environment
Selected Publications
1. Patents* IN-SITU ELECTRICALLY PROBING TRANSMISSION ELECTRON MICROSCOPY HOLDER USING PIVOT MOVEMENT FUNTIONALIZED FEEDTHROUGH, (KOR 10-1033352, 2011)2. Papers* Quantitative measurement of cementite dissociation in drawn pearlitic steel , Mat. Sci. Eng. A-Struct., 528, 4947 (2011)
* Microstructural Investigation of Bilayer Growth of In- and Ga-Rich InGaN Grown by Chemical Vapor Deposition , J. Electron. Mater., 38, 518 (2009)
* Oxide formation of transformation-induced plasticity-aided steel during dew-point control , Scripta Mater., 57, 113 (2007) * Effective removal of Ga residue from focused ion beam using a plasma cleaner , Ultramicroscopy, 107, 368 (2007) [50 publications in recent 3 years]
Seoul National Univ. DMSE
People
Faculty
Kim, Young-Woon
김영운
youngwk@snu.ac.kr
Mailstop
33-307
Phone
880-7977
Fax
883-8197
Homepage
http://tem.snu.ac.kr/
Education
- 1995
Ph. D : University of Illinois at Urbana-Champaign, Department of Materials Science & Engineering
- 1985
M.S : M.S : Seoul National University, Department of Metallurgical Engineering
- 1983
B.S : Seoul National University, Department of Metallurgical Engineering
Career
- 2001-present
Seoul National University, Professor
- 1999-2001
University of Illinois, Material Laboratory, Senior Researcher
- 1995-1999
Intel Corp. (Santa Clara, USA), Senior Process Engineer
- 1986-1988
Korea Advanced Institute of Science and Technology, Functional Metallic Material Laboratory, Researcher
Research Interests
1. In-situ Electron Microscopy* Correlation between micro-structure and physical properties in nano-electrical ReRAM devices
* Cathodeluminescence of materials for LED and solar cells.
* Initial stage of surface reaction in anodic reaction of lithium rechargeable battery in in-situ TEM
* In-situ heating-deformation dynamics in high-Mn steels.
* Oxidation kinetics in the pure metal surface using in-situ oxidation2. Interface Control* Surface oxide control in high-Mn steel using dew-point and plasma treatment
* High-Al coating on alloy steel for automobile
* Decomposition of Mg alloy under bio-chemical environment
Selected Publications
1. Patents* IN-SITU ELECTRICALLY PROBING TRANSMISSION ELECTRON MICROSCOPY HOLDER USING PIVOT MOVEMENT FUNTIONALIZED FEEDTHROUGH, (KOR 10-1033352, 2011)2. Papers* Quantitative measurement of cementite dissociation in drawn pearlitic steel , Mat. Sci. Eng. A-Struct., 528, 4947 (2011)
* Microstructural Investigation of Bilayer Growth of In- and Ga-Rich InGaN Grown by Chemical Vapor Deposition , J. Electron. Mater., 38, 518 (2009)
* Oxide formation of transformation-induced plasticity-aided steel during dew-point control , Scripta Mater., 57, 113 (2007) * Effective removal of Ga residue from focused ion beam using a plasma cleaner , Ultramicroscopy, 107, 368 (2007) [50 publications in recent 3 years]